Depth-Resolved Imaging of Surfaces and Interfaces in MFI-Type Zeolite Crystals via Multislice Electron Ptychography

Journal:

Advanced Materials

Published:

2026-03-18

DOI:

10.1002/adma.202519613

Affiliations:

7

Authors:

7

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Institutions	Authors	Share
Cornell University, United States of America (USA)	3.000000	0.43
State Key Laboratory of Fine Chemicals, DUT, China	2.000000	0.29
South China University of Technology (SCUT), China	1.500000	0.21
State Key Laboratory of Advanced Papermaking and Paper-based Materials, China	0.500000	0.07

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