High-Density Topological Defect Array by Two-Step Interference Photoalignment

Journal:
Advanced Materials
Published:
DOI:
10.1002/adma.72607
Affiliations:
2
Authors:
3
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Institutions Authors Share
Ghent University (UGent), Belgium
2.000000
 0.67
State Key Laboratory of Displays and Optoelectronics, China
1.000000
 0.33
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