A Low-Background, High-Flatness Mounting Method for In Situ SIMS Isotopic Analysis for Fine-Grained Samples

Journal:

Analytical Chemistry

Published:

2025-09-15

DOI:

10.1021/acs.analchem.5c04185

Affiliations:

3

Authors:

8

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Institutions	Authors	Share
CAS Key Laboratory of Earth and Planetary Physics (EPP), IGG CAS, China	6.000000	0.75
University of Chinese Academy of Sciences (UCAS), China	1.000000	0.13
State Key Laboratory of Lithospheric and Environmental Coevolution, China	1.000000	0.13

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