Re-Evaluating the Impact of Stacked Electrodes in Metal–Semiconductor Contacts Based on a-IGO Thin-Film Transistors
- Journal:
- The Journal of Physical Chemistry Letters
- Published:
- Affiliations:
- 3
- Authors:
- 12
| Institutions | Authors | Share |
|---|---|---|
| Guangxi University (GXU), China | 0.83 | |
| Center on Nanoenergy Research (BINN CAS-GXU), China | 0.08 | |
| MOE Key Laboratory for Micro/Nano Optoelectronic Devices, HNU, China | 0.08 |