ALD-Driven Ultrathin IGZO Neuromorphic Transistors with Defect-Engineered 1/f Noise for Stable Multimodal Information Encryption

Journal:
The Journal of Physical Chemistry Letters
Published:
DOI:
10.1021/acs.jpclett.5c03934
Affiliations:
3
Authors:
8
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Institutions Authors Share
Anhui University (AHU), China
6.500000
 0.81
Hefei Institute of Technology, China
1.500000
 0.19
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