Thermal Dephasing of Localized Vibrations and Quasi-Elastic Scattering in Heavily Doped Silicon: Raman Spectroscopic Evidence

Journal:
The Journal of Physical Chemistry Letters
Published:
DOI:
10.1021/acs.jpclett.6c00665
Affiliations:
2
Authors:
9
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Institutions Authors Share
Indian Institute of Technology Indore (IIT Indore), India
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