Dephasing Mechanisms of Topologically Protected 2D Surface Carriers in Sputtered SnTe Thin Films

Journal:

Nano Letters

Published:

2025-08-06

DOI:

10.1021/acs.nanolett.5c01902

Affiliations:

7

Authors:

17

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Institutions	Authors	Share
Bielefeld University, Germany	8.000000	0.47
University of Duisburg-Essen (UDE), Germany	4.333333	0.25
University of Warmia and Mazury in Olsztyn (UWM), Poland	2.000000	0.12
University Alliance Ruhr (UA Ruhr), Germany	1.333333	0.08
Islamic Azad University (IAU), Iran	1.000000	0.06
Center for Nanointegration Duisburg-Essen (CENIDE), Germany	0.333333	0.02

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