Unveiling Radiation-Tolerant Thickness in a-IGZO Thin-Film Transistors with Sub-10 nm Film and Restoring Abnormalities via Energy-Efficient Electrothermal Annealing

Journal:
Nano Letters
Published:
DOI:
10.1021/acs.nanolett.5c02067
Affiliations:
4
Authors:
15
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Institutions Authors Share
Jeonbuk National University (JBNU), South Korea
9.000000
 0.60
Hongik University, South Korea
4.000000
 0.27
University of Minnesota (UMN), United States of America (USA)
1.000000
 0.07
University of Seoul (UOS), South Korea
1.000000
 0.07
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