Noninvasive van der Waals Interface Integrations for Intrinsic 2D Semiconductor Characterization

Journal:

Nano Letters

Published:

2025-09-25

DOI:

10.1021/acs.nanolett.5c03799

Affiliations:

3

Authors:

11

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Institutions	Authors	Share
State Key Laboratory for Advanced Metals and Materials, USTB, China	3.666667	0.33
MOE Key Laboratory of Advanced Materials and Devices for Post-Moore Chips, USTB, China	3.666667	0.33
University of Science and Technology Beijing (USTB), China	3.666667	0.33

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