Slow Charge Dynamics at 2D Material/Dielectric Interfaces Revealed by Multimodal Microscopy

Journal:

Nano Letters

Published:

2026-01-14

DOI:

10.1021/acs.nanolett.5c05741

Affiliations:

4

Authors:

8

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Institutions	Authors	Share
MOE Key Laboratory of Artificial Micro- and Nano-structures, WHU, China	5.500000	0.69
Research Center for Electronic and Optical Materials, NIMS, Japan	1.000000	0.13
WPI International Center for Materials Nanoarchitectonics (WPI-MANA), NIMS, Japan	1.000000	0.13
Wuhan Institute of Quantum Technology, China	0.500000	0.06

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