Slow Charge Dynamics at 2D Material/Dielectric Interfaces Revealed by Multimodal Microscopy

Journal:
Nano Letters
Published:
DOI:
10.1021/acs.nanolett.5c05741
Affiliations:
4
Authors:
8
Institutions Authors Share
MOE Key Laboratory of Artificial Micro- and Nano-structures, WHU, China
5.500000
0.69
Research Center for Electronic and Optical Materials, NIMS, Japan
1.000000
0.13
WPI International Center for Materials Nanoarchitectonics (WPI-MANA), NIMS, Japan
1.000000
0.13
Wuhan Institute of Quantum Technology, China
0.500000
0.06