Leakage-Induced Space-Charge Accumulation and Interfacial Field Redistribution in a Dielectric Nanocapacitor Revealed by Operando Electron Holography

Journal:
Nano Letters
Published:
DOI:
10.1021/acs.nanolett.6c00753
Affiliations:
2
Authors:
7
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Institutions Authors Share
Center for Materials Elaboration and Structural Studies (CEMES), France
6.000000
 0.86
Spintronics and Technology of Components (SPINTEC), France
1.000000
 0.14
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