Multiple ZT Peaks Caused by van Hove Singularities in Semiconducting Carbon Nanotube Films

Journal:
ACS Nano
Published:
DOI:
10.1021/acsnano.5c07264
Affiliations:
8
Authors:
12
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Institutions Authors Share
Tokyo Metropolitan University (TMU), Japan
7.500000
 0.63
National Metrology Institute of Japan (NMIJ), AIST, Japan
2.500000
 0.21
Rice University, United States of America (USA)
2.000000
 0.17
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