Low-Angle Rotational Interferometric Scattering Microscopy Enables Real-Time, Deep-Field Visualization of Stress-Driven Nanowire Oxidation Dynamics

Journal:
ACS Nano
Published:
DOI:
10.1021/acsnano.5c07556
Affiliations:
2
Authors:
6
Institutions Authors Share
Hefei National Laboratory for Physical Sciences at the Microscale (HFNL), USTC, China
5.500000
0.92
University of Science and Technology of China (USTC), China
0.500000
0.08