Magnetic Proximity Coupling to Defects in a Two-Dimensional Semiconductor
- Journal:
- ACS Nano
- Published:
- DOI:
- 10.1021/acsnano.5c09258
- Affiliations:
- 5
- Authors:
- 11
| Institutions | Authors | Share |
|---|---|---|
| University of Delaware (UD), United States of America (USA) | 0.77 | |
| National Institute for Materials Science (NIMS), Japan | 0.18 | |
| Quy Nhon University (QNU), Vietnam | 0.05 |