Highly Reliable MoS2 Flash Memory with Ultrathin TaOx Tunneling Layer Formed via Partial Oxidation of TaS2 Floating Gate

Journal:
ACS Nano
Published:
Affiliations:
4
Authors:
11
Institutions Authors Share
Sungkyunkwan University (SKKU), South Korea
9.000000
0.82
Chungnam National University (CNU), South Korea
2.000000
0.18