Highly Reliable MoS2 Flash Memory with Ultrathin TaOx Tunneling Layer Formed via Partial Oxidation of TaS2 Floating Gate
- Journal:
- ACS Nano
- Published:
- Affiliations:
- 4
- Authors:
- 11
| Institutions | Authors | Share |
|---|---|---|
| Sungkyunkwan University (SKKU), South Korea | 0.82 | |
| Chungnam National University (CNU), South Korea | 0.18 |