Artifact-Free Dark-Field Scattering Microspectroscopy for Single-Particle Chiral Measurements at the Nanoscale

Journal:

ACS Nano

Published:

2026-01-19

DOI:

10.1021/acsnano.5c15757

Affiliations:

3

Authors:

7

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Institutions	Authors	Share
University of Massachusetts Amherst (UMass Amherst), United States of America (USA)	5.000000	0.71
Joint School of Nanoscience and Nanoengineering (JSNN), United States of America (USA)	1.000000	0.14
Ohio University (Ohio), United States of America (USA)	1.000000	0.14

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