Molecular Semiconductor-Induced Deep Trapping Enables Ultrahigh-Performance Dielectric Elastomers

Journal:
ACS Nano
Published:
DOI:
10.1021/acsnano.5c17142
Affiliations:
2
Authors:
7
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Institutions Authors Share
Ningxia University (NXU), China
6.000000
 0.86
State Key Laboratory of Power System Operation and Control, Tsinghua, China
1.000000
 0.14
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