A Layered Wide-Bandgap BiOF Gate Dielectric with a High Dielectric Constant

Journal:

ACS Nano

Published:

2026-03-15

DOI:

10.1021/acsnano.5c18038

Affiliations:

6

Authors:

15

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Institutions	Authors	Share
Nankai University (NKU), China	9.500000	0.63
Westlake University, China	2.000000	0.13
MOE Key Laboratory of Weak Light Nonlinear Photonics, NKU, China	2.000000	0.13
Chongqing University (CQU), China	1.000000	0.07
MOE Key Laboratory of Advanced Energy Materials Chemistry (KLAEMC), NKU, China	0.500000	0.03

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