Depth-Resolved X-Ray Nanoimaging of Coherent and Incoherent Energy Transport in Silicon Carbide

Journal:

ACS Nano

Published:

2026-04-20

DOI:

10.1021/acsnano.5c20241

Affiliations:

4

Authors:

11

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Institutions	Authors	Share
Argonne National Laboratory (ANL), United States of America (USA)	8.000000	0.73
Center for Nanoscale Materials (CNM), ANL, United States of America (USA)	2.000000	0.18
The University of Chicago (UChicago), United States of America (USA)	1.000000	0.09

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