Selective Defect Engineering for Gate-Controlled yet Contact-Transparent Bi2O2Se Transistors

Journal:

ACS Nano

Published:

2026-05-26

DOI:

10.1021/acsnano.6c04248

Affiliations:

8

Authors:

16

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Institutions	Authors	Share
National Tsing Hua University (NTHU), Taiwan	6.000000	0.38
National Taiwan University (NTU), Taiwan	5.000000	0.31
Institute of Atomic and Molecular Sciences (IAMS), Academia Sinica, Taiwan	1.000000	0.06
TSMC, Taiwan	1.000000	0.06
Department of Materials and Chemistry (DMC), AIST, Japan	1.000000	0.06
The University of Osaka (UOsaka), Japan	1.000000	0.06
National Chung Hsing University (NCHU), Taiwan	1.000000	0.06

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