Direct Probing the Electrical Double Layer at Graphite/Nafion Interface via Depth Profiling APXPS

Journal:
Journal of the American Chemical Society
Published:
DOI:
10.1021/jacs.5c11569
Affiliations:
4
Authors:
12
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Institutions Authors Share
ShanghaiTech University, China
10.000000
10.000000
 0.83
Shanghai Jiao Tong University (SJTU), China
1.000000
 0.08
Shanghai Synchrotron Radiation Facility (SSRF), SARI CAS, China
1.000000
 0.08
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