Tracing the Origin of Driving Force of Photoinduced Interfacial Electron Transfer Reaction by Colocated Scanning Electrochemical Microscopy

Journal:

Journal of the American Chemical Society

Published:

2026-05-27

DOI:

10.1021/jacs.5c19712

Affiliations:

4

Authors:

12

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Institutions	Authors	Share
State Key Laboratory of Physical Chemistry of Solid Surfaces (PCOSS), XMU, China	8.500000	0.71
Chimie Physique et Chimie du Vivant (CPCV), France	2.500000	0.21
Aerospace Research Institute of Materials and Processing Technology (ARIMPT), CASC, China	0.500000	0.04
Guizhou Normal University (GZNU), China	0.500000	0.04

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