Mitigating Electrode Stress via Self-Constructed Interfacial Carrier Networks in High-Areal-Capacity SiOx Anodes

Journal:

Journal of the American Chemical Society

Published:

2026-06-22

DOI:

10.1021/jacs.6c00956

Affiliations:

4

Authors:

9

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Institutions	Authors	Share
Harbin Institute of Technology (HIT), China	4.000000	0.44
State Key Laboratory of Space Power‐Sources, China	2.500000	0.28
State Key Laboratory for Mechanical Behavior of Materials, XJTU, China	1.500000	0.17
Shanghai Institute of Technology (SIT), China	1.000000	0.11