Spatially Quantitative Profiling of Defect Density for Hydrogen-Induced Passivation Mechanism of Metal–Insulator–Semiconductor Photoanodes

Journal:
Journal of the American Chemical Society
Published:
DOI:
10.1021/jacs.6c01240
Affiliations:
7
Authors:
10
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Institutions Authors Share
Collaborative Innovation Center of Chemical Science and Engineering (Tianjin), China
4.350000
 0.44
Tianjin University (TJU), China
3.950000
 0.40
Haihe Laboratory of Sustainable Chemical Transformations, China
0.600000
 0.06
Joint School of National University of Singapore and Tianjin University, China
0.600000
 0.06
State Key Laboratory of Synthetic Biology, TJU, China
0.250000
 0.03
Tianjin Normal University (TJNU), China
0.250000
 0.03
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