Revealing interfacial failure mechanism of silicon based all solid state batteries via cryogenic electron microscopy

Journal:

Nature Communications

Published:

2025-11-04

DOI:

10.1038/s41467-025-64697-0

Affiliations:

6

Authors:

23

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Institutions	Authors	Share
State Key Laboratory of Metastable Materials Science and Technology, YSU, China	15.833333 15.833333	0.69
Xiangtan University (XTU), China	4.500000	0.20
Guilin Electrical Equipment Research Institute, China	1.000000	0.04
Anhui University (AHU), China	1.000000	0.04
Yanshan University (YSU), China	0.333333	0.01
MOE Key Laboratory of Advanced Energy Materials Chemistry (KLAEMC), NKU, China	0.333333	0.01

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