High-density three-dimensional integration of dynamic random-access memory using vertical dual-gate IGZO TFTs
- Journal:
- Nature Communications
- Published:
- Affiliations:
- 4
- Authors:
- 28
| Institutions | Authors | Share |
|---|---|---|
| Institute of Microelectronics (IME), CAS, China | 0.61 | |
| Beijing Superstring Academy of Memory Technology, China | 0.36 | |
| University of Cambridge, United Kingdom (UK) | 0.02 | |
| Shandong University (SDU), China | 0.02 |