A standardized approach to characterize hysteresis in 2D-materials-based transistors for stability benchmarking and performance projection

Journal:

Nature Communications

Published:

2025-11-21

DOI:

10.1038/s41467-025-66210-z

Affiliations:

8

Authors:

26

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Institutions	Authors	Share
Vienna University of Technology (TU Wien), Austria	15.000000 15.000000	0.58
Peking University (PKU), China	5.000000	0.19
Huawei Technologies Research and Development Belgium, Belgium	3.000000	0.12
State Key Laboratory of Quantum Functional Materials, China	1.000000	0.04
The Pennsylvania State University (Penn State), United States of America (USA)	1.000000	0.04
Nanyang Technological University (NTU), Singapore	1.000000	0.04

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