Low breakdown field and high ionization index in ReSe2 avalanche field-effect transistors

Journal:
Nature Communications
Published:
DOI:
10.1038/s41467-026-69994-w
Affiliations:
4
Authors:
13
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Institutions Authors Share
National University of Singapore (NUS), Singapore
8.000000
 0.62
The Hong Kong University of Science and Technology (HKUST), China
3.000000
 0.23
The Chinese University of Hong Kong (CUHK), China
2.000000
 0.15
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