Synthetic data-driven deep learning for label-free autonomous atomic force microscopy

Journal:
Nature Communications
Published:
DOI:
10.1038/s41467-026-70421-3
Affiliations:
3
Authors:
12
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Institutions Authors Share
Oak Ridge National Laboratory (ORNL), United States of America (USA)
10.000000
10.000000
 0.83
The University of Sheffield, United Kingdom (UK)
2.000000
 0.17
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