Templated perpendicular ferroelectricity in textured Aurivillius oxide-based thin films

Journal:

Nature Communications

Published:

2026-03-13

DOI:

10.1038/s41467-026-70676-w

Affiliations:

5

Authors:

14

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Institutions	Authors	Share
Institute of Physics (IOP), CAS, China	4.333333	0.31
CAS Songshan Lake Materials Laboratory, China	4.333333	0.31
Tsientang Institute for Advanced Study (TIAS), China	2.833333	0.20
State Key Laboratory of Silicon and Advanced Semiconductor Materials, ZJU, China	2.000000	0.14
The Hong Kong Polytechnic University (PolyU), China	0.500000	0.04

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