Turing-patterned TaS enables sub-2 nm diffusion barrier for advanced Cu interconnects
- Journal:
- Nature Communications
- Published:
- Affiliations:
- 4
- Authors:
- 16
| Institutions | Authors | Share |
|---|---|---|
| Peking University (PKU), China | 0.92 | |
| Beijing Advanced Innovation Center for Integrated Circuits, China | 0.08 |