In situ characterization of post-synthetic metalation in porous salt thin films

Journal:
Chemical Science
Published:
DOI:
10.1039/d4sc08061k
Affiliations:
4
Authors:
11
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Institutions Authors Share
Texas A&M University (TAMU), United States of America (USA)
7.000000
 0.64
Indiana University Bloomington (IUB), United States of America (USA)
4.000000
 0.36
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