Contact line dynamics modulated by electrode roughness determines bubble detachment size

Journal:
Chemical Communications
Published:
DOI:
10.1039/d5cc02994e
Affiliations:
2
Authors:
4
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Institutions Authors Share
Chongqing University (CQU), China
3.000000
 0.75
Henan Academy of Sciences, China
1.000000
 0.25
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