Multi-modal impedance and X-ray characterization enables simultaneous detection of bulk and interfacial crystallization

Journal:
Chemical Communications
Published:
DOI:
10.1039/d5cc03808a
Affiliations:
4
Authors:
8
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Institutions Authors Share
Catholic University of Leuven (KU Leuven), Belgium
5.000000
 0.63
European Synchrotron Radiation Facility (ESRF), France
2.000000
 0.25
Johannes Kepler University of Linz (JKU), Austria
1.000000
 0.13
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