Advanced oxidation processes at water/hydrophobic interfaces: energy-fluctuation mechanism and electron utilization quantification

Journal:
Chemical Science
Published:
DOI:
10.1039/d5sc08827e
Affiliations:
3
Authors:
10
Institutions Authors Share
Southwest University (SWU), China
8.000000
0.80
Shanghai Institute of Microsystem and Information Technology (SIMIT), CAS, China
1.000000
0.10
Zunyi Normal College (ZYNC), China
1.000000
0.10