Modulated amplitude reflectance spectroscopy to map in-channel charge carrier concentration and drift velocity in organic field effect transistors
- Journal:
- Applied Physics Letters
- Published:
- DOI:
- 10.1063/5.0265657
- Affiliations:
- 2
- Authors:
- 11
| Institutions | Authors | Share |
|---|---|---|
| Pomona College, United States of America (USA) | 0.91 | |
| SkyWater Technology, United States of America (USA) | 0.09 |