The in-plane anisotropy of topological semimetal Nb3SiTe6 investigated by angle-resolved polarized Raman spectroscopy

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0269647
Affiliations:
1
Authors:
8
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Institutions Authors Share
MOE Key Laboratory of Advanced Optoelectronic Quantum Architecture and Measurement, BIT, China
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