High-resolution visualization of sidewall defects in gallium nitride micro light-emitting diode via multi-physical field luminescence imaging microscopy

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0270196
Affiliations:
3
Authors:
8
Go to article
Institutions Authors Share
Xiamen University (XMU), China
8.000000
 1.00
Interested in Biomedical Engineering?