Microscopic-scale defect analysis on bβ/b-Ga2O3 through microscopy

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0272451
Affiliations:
5
Authors:
9
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Institutions Authors Share
National Institute of Standards and Technology (NIST), United States of America (USA)
5.333333
 0.59
Kwangwoon University, South Korea
1.333333
 0.15
George Mason University (GMU), United States of America (USA)
1.333333
 0.15
Center for Nanoscale Science and Technology (CNST), NIST, United States of America (USA)
1.000000
 0.11
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