Ferroelectric polarization-driven ionic modulation enabling enhanced self-rectification in NiOx/HfO2−x: Al memristors

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0273610
Affiliations:
2
Authors:
9
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Institutions Authors Share
Jiangsu University (JSU), China
8.000000
 0.89
Jiangsu University of Science and Technology (JUST), China
1.000000
 0.11
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