Two-dimensional metals thickness scaling effect on electrical contact in metal–semiconductor junctions: Carrier transport and ultrafast dynamics study
- Journal:
- Applied Physics Letters
- Published:
- DOI:
- 10.1063/5.0274847
- Affiliations:
- 3
- Authors:
- 7
| Institutions | Authors | Share |
|---|---|---|
| Nanjing University of Posts and Telecommunications (NUPT), China | 0.71 | |
| Henan University of Science and Technology (HAUST), China | 0.14 | |
| Yangzhou University (YZU), China | 0.14 |