Alleviation of self-heating degradation in polycrystalline silicon thin-film transistors via voltage pulse modulation

Journal:

Applied Physics Letters

Published:

2025-09-01

DOI:

10.1063/5.0274914

Affiliations:

5

Authors:

7

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Institutions	Authors	Share
Peking University Shenzhen Graduate School (PKUSZ), China	2.000000	0.29
State Key Laboratory of Displays and Optoelectronics, China	2.000000	0.29
State Key Laboratory of Radio Frequency Heterogeneous Integration, China	1.000000	0.14
Shenzhen University (SZU), China	1.000000	0.14
Empyrean Technology, China	1.000000	0.14

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