Rapid, versatile, and reliable metrology for multi-layer transition metal dichalcogenide thin films using atomic force microscopy to investigate surface grain distributions

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0276152
Affiliations:
4
Authors:
13
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Institutions Authors Share
Tyndall National Institute (TNI), Ireland
8.000000
 0.62
University of Padova (UNIPD), Italy
2.833333
 0.22
INFN Legnaro National Laboratory (LNL), Italy
1.833333
 0.14
Institute of Nanostructured Materials (ISMN), CNR, Italy
0.333333
 0.03
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