Relaxation-free HgCdTe heteroepitaxy via lattice-matching: X-ray reciprocal space mapping characterization and dual-color focal plane array performance validation

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0276896
Affiliations:
1
Authors:
11
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Institutions Authors Share
NORINCO Group, China
11.000000
11.000000
 1.00
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