In2O3 gap states in amorphous and poly-crystalline phases: Band tail and defect level characterization by subgap photocurrent spectroscopy

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0276910
Affiliations:
3
Authors:
4
Go to article
Institutions Authors Share
National Institute of Advanced Industrial Science and Technology (AIST), Japan
4.000000
 1.00
Interested in Electronics, Sensors and Digital Hardware?