Investigation of degradation mechanisms and post-annealing effects in polymer field-effect transistors under x-ray irradiation

Journal:

Applied Physics Letters

Published:

2025-10-20

DOI:

10.1063/5.0276957

Affiliations:

3

Authors:

9

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Institutions	Authors	Share
Nanjing University of Posts and Telecommunications (NUPT), China	6.000000	0.67
Guizhou Normal University (GZNU), China	2.000000	0.22
Guangdong Greater Bay Area Institute of Integrated Circuit and System, China	1.000000	0.11

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