In situ transmission electron microscopy observation of N ion radiation damage in the GaN material at high temperature

Journal:

Applied Physics Letters

Published:

2025-09-30

DOI:

10.1063/5.0280526

Affiliations:

5

Authors:

14

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Institutions	Authors	Share
Northwest Institute of Nuclear Technology (NINT), China	5.500000	0.39
Xiamen University (XMU), China	3.000000	0.21
State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, PKU, China	3.000000	0.21
Peking University (PKU), China	1.500000	0.11
Yangzhou University (YZU), China	1.000000	0.07

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