Enhanced conducting domain wall operation by thickness mitigated depolarization and imprint effects
- Journal:
- Applied Physics Letters
- Published:
- DOI:
- 10.1063/5.0283237
- Affiliations:
- 3
- Authors:
- 5
| Institutions | Authors | Share |
|---|---|---|
| State Key Laboratory of Integrated Chip and System, Fudan University, China | 0.50 | |
| State Key Laboratory of Surface Physics (SKLSP), Fudan University, China | 0.40 | |
| Fudan University, China | 0.10 |