Electrical characterization of hexagonal SiGe

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0287884
Affiliations:
2
Authors:
7
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Institutions Authors Share
IBM Research - Zurich, Switzerland
4.000000
 0.57
Eindhoven University of Technology (TU/e), Netherlands
3.000000
 0.43
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