On the thickness-driven metal–insulator transitions of buried LaNiO3 films

Journal:

Applied Physics Letters

Published:

2025-11-10

DOI:

10.1063/5.0289069

Affiliations:

1

Authors:

12

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Institutions	Authors	Share
MOE Key Laboratory of Polar Materials and Devices, ECNU, China	12.000000 12.000000	1.00

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